Here you will find the procedures from our flexible accreditation scope:
1) Brinell: DIN EN ISO 6506-2:2019-03 / ASTM E10:2018
- 60 – 600 HBW
- extended measurement uncertainty 2%
2) Vickers: DIN EN ISO 6507-2:2018- 07/ ASTM E92:2017 / ASTM E384:2022
- 100 – 900 HV
- extended measurement uncertainty HV0,01 bis HV3 – 2%
- extended measurement uncertainty HV5 bis HV100 – 1,5%
- but not in each case < 1,5*Ucrm
3) Knoop: DIN EN ISO 4545-2:2018-07 / ASTM E384:2022
- 250 – 850 HK
- extended measurement uncertainty 2%
4) Rockwell: DIN EN ISO 6508-2:2015-06 / ASTM E18-2022
- 20 – 88 HRA / extended measurement uncertainty 1,0 HRA
- 20 – 100 HRB / extended measurement uncertainty 1,0 HRB
- 20 – 70 HRC / extended measurement uncertainty 1,0 HRC
- 70 – 100 HRE / extended measurement uncertainty 1,4 HRE
- 60 – 100 HRF / extended measurement uncertainty 1,0 HRF
- 40 – 100 HRK / extended measurement uncertainty 1,0 HRK
- 70 – 94 HR15N / extended measurement uncertainty 1,0 HR15N
- 42 – 86 HR30N / extended measurement uncertainty 1,0 HR30N
- 20 – 77 HR45N / extended measurement uncertainty 1,0 HR45N
- 67 – 93 HR15T / extended measurement uncertainty 1,5 HR15T
- 29 – 82 HR30T / extended measurement uncertainty 1,5 HR30T
- 10 – 72 HR45T / extended measurement uncertainty 1,5 HR45T
5) Optical indentation measuring devices for hardness testing machines – Brinell / Vickers / Knoop – DIN und ASTM
- 0 – <2 mm / extended measurement uncertainty 0,2µm
- 2 – 10 mm / extended measurement uncertainty 0,2 μm + 2·10-7 · l
6) Depth measuring devices of hardness testing machines – Rockwell – DIN und ASTM
- 0 – 0,2 mm / extended measurement uncertainty ± 0,3 μm
7) Testing forces – Brinell / Vickers / Rockwell / Knoop – DIN und ASTM
- 0,5 N – 30 kN / extended measurement uncertainty 0,24%
8) Hardness testing devices according to the UCI method: DIN 50159-2:2022-06
- 100 – 900 HV
- extended measurement uncertainty 2*Ucrm
9) Hardness testing devices according to the Leeb method: DIN EN ISO 16859-2:2016-02
- 300 – 900 HLD
- 400 – 700 HLD
- extended measurement uncertainty 2*Ucrm